Failure Analysis Of Hot-electron Effect On Power Rf N-ldmos

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Mexican Peso
MXN1,445.47
SKU:
9783659200625
Autor:
Belaid Mohamed Ali
Editorial:
LAP Lambert Academic Publishing
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Importante: este producto es importado y puede tener una demora de 30 días. 

Titulo: Failure Analysis Of Hot-electron Effect On Power Rf N-ldmos

Formato: Blanda

Autor: Belaid Mohamed Ali

Editorial: LAP Lambert Academic Publishing

Lenguaje: English

ISBN: 9783659200625

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