Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications

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Uruguayan Peso
$4,980.57
SKU:
9783527349517
Autor:
Wee
Editorial:
Global Research
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Importante: este producto es importado y puede tener una demora de 30 días. 

Titulo: Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis, and Applications

Año: 2022

Autor: Wee

Editorial: Global Research

Lenguaje: 

ISBN: 9783527349517

SKU-INT: WLEY050582

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